1 36-00-04-000 ver. 1.0.0 aeroflex microelectronics solutions - hirel UT54ACS273E octal d-flip-flops with clear march 2015 www.aeroflex.com/logic datasheet features ? contains eight flip-flops with single-rail outputs ? buffered clock and direct clear inputs ? individual data input to each flip-flop ? applications include: - buffer/storage registers, shift registers and pattern gener- ators ? 0.6 m crh cmos process - latchup immune ? high speed ? low power consumption ? wide power supply operating range from 3.0v to 5.5v ? available qml q or v processes ? 20-lead flatpack ? UT54ACS273E - smd 5962-96578 description the UT54ACS273E is a performance and voltage enhanced version of the ut54acs273 po sitive-edge-triggered d-type flip-flop with a direct clear input. information at the d inputs meet ing the setup time requirements is transferred to the q outputs on the positive-going edge of the clock pulse. when the clock input is at either the high or low level, the d input signal has no effect at the output. the device is characterized over full hirel temperature range of -55 c to +125 c. function table pinout 20-lead flatpack topview logic symbol inputs output clr clk d x q x l x x l h h h h l l h l x no change 1 2 3 4 5 7 6 20 19 18 17 16 14 15 clr 1q 1d 2d 2q 3q 3d v dd 8q 8d 7d 7q 6d 8 13 4d 5d 6q 9 12 4q 5q 10 11 v ss clk note: 1. logic symbol in accordance with ansi/ieee standard 91-1984 and iec publication 617-12. (1) c1 (3) 1d (4) 2d (7) (2) 1q (6) (5) 2q 3d (8) 4d (13) 5d (14) 6d 3q (15) 6q (12) 5q (9) 4q (17) 7d (18) 8d (19) 8q (16) 7q (11) r clr clk 1d
2 36-00-04-000 ver. 1.0.0 aeroflex microelectroni cs solutions - hirel logic diagram
3 36-00-04-000 ver. 1.0.0 aeroflex microelectroni cs solutions - hirel operational environment 1 notes: 1. logic will not latchup during radiation expo sure within the limits defined in the table. 2. device storage elements are immune to seu affects. absolute maximum ratings 1 note: 1. stresses outside the listed absolute maxi mum ratings may cause permanent damage to the device. this is a stress rating only, functional operation of the device at these or any other conditions beyond limits indicated in the operational s ections is not recommended. ex posure to absolute maximum ra ting conditions for extended periods may affect device reliability. 2. per mil-std-883, method 1012.1, section 3.4.1, p d = (t j(max) - t c(max) ) / jc recommended operating conditions parameter limit units total dose 1.0e6 rads(si) seu threshold 2 108 mev-cm 2 /mg sel threshold 120 mev-cm 2 /mg neutron fluence 1.0e14 n/cm 2 symbol parameter limit units v dd supply voltage -0.3 to 7.0 v v i/o voltage any pin -0.3 to v dd +0.3 v t stg storage temperature range -65 to +150 c t j maximum junction temperature +175 c t ls lead temperature (soldering 5 seconds) +300 c jc thermal resistance junction to case 15 c/w i i dc input current 10 ma p d 2 maximum package po wer dissipation permitted @ t c = +125 o c 3.2 w symbol parameter limit units v dd supply voltage 3.0 to 5.5 v v in input voltage any pin 0 to v dd v t c temperature range -55 to + 125 c
4 36-00-04-000 ver. 1.0.0 aeroflex microelectroni cs solutions - hirel dc electrical characteristics for the UT54ACS273E 7 ( v dd = 3.0v to 5.5v; v ss = 0v 6 ; -55 c < t c < +125 c) symbol description condition min max unit v il low-level input voltage 1 v dd from3.0v to 5.5v 0.3v dd v v ih high-level input voltage 1 v dd from3.0v to 5.5v 0.7v dd v i in input leakage current v in = v dd or v ss -1 +1 a v ol low-level output voltage 3 i ol = 100 a 0.25 v v oh high-level output voltage 3 i oh = -100 a v dd -0.25 v i os1 short-circuit output current 2 ,4 v o = v dd and v ss v dd from 4.5v to 5.5v -200 +200 ma i os2 short-circuit output current 2 ,4 v o = v dd and v ss v dd from 3.0v to 3.6v -100 +100 ma i ol1 low level output current 9 v in = v dd or v ss v ol = 0.4v v dd from 4.5v to 5.5v +8 ma i ol2 low level output current 9 v in = v dd or v ss v ol = 0.4v v dd from 3.0v to 3.6v +6 ma i oh1 high level output current 9 v in = v dd or v ss v oh = v dd -0.4v v dd from 4.5v to 5.5v -8 ma i oh2 high level output current 9 v in = v dd or v ss v oh = v dd -0.4v v dd from 3.0v to 3.6v -6 ma p total1 power dissipation 2, 8, 10 c l = 50pf v dd = 4.5v to 5.5v 1.5 mw/ mhz
5 36-00-04-000 ver. 1.0.0 aeroflex microelectroni cs solutions - hirel notes: 1. functional tests are conducted in accordance with mil-std-883 with th e following input test conditions: v ih = v ih (min) + 20%, - 0%; v il = v il (max) + 0%, - 50%, as specified herein, for ttl, cmos, or schm itt compatible inputs. devices may be test ed using any input voltage within the abov e specified range, but are guaranteed to v ih (min) and v il (max). 2. supplied as a design limit but not guaranteed or tested. 3. per mil-prf-38535, for current density 5.0e5 amps/cm 2 , the maximum product of load capac itance (per output buffer) times frequency should not exceed 3,765pf/ mhz. 4. not more than one output may be shorted at a time for maximum duration of one second. 5. capacitance measured for initial qualifi cation and when design changes may affect the value. capacitance is measured between the designated terminal and v ss at frequency of 1mhz and a signal amplitude of 50mv rms maximum. 6. maximum allowable relative shift equals 50mv. 7. for devices procured with a total ionizing dose tolerance guarantee, the po st-irradiation performance is guaranteed at 25c per mil-std-883 method 1019 condition a up to the maximum tid level procured. 8. power dissipation specified per switching output. 9. guaranteed by character ization, but not tested. 10. power does not include power contribution of any ttl output sink current. p total2 power dissipation 2, 8, 10 c l = 50pf v dd = 3.0v to 3.6v 0.7 mw/ mhz i ddq quiescent supply current v in = v dd or v ss v dd from 3.0v to 5.5v 25 a c in input capacitance 5 ? = 1mhz v dd = 0v 15 pf c out output capacitance 5 ? = 1mhz v dd = 0v 15 pf
6 36-00-04-000 ver. 1.0.0 aeroflex microelectroni cs solutions - hirel ac electrical characteristics for the UT54ACS273E 2 ( v dd = 3.0v to 5.5v; v ss = 0v 1 ; -55 c < t c < +125 c) notes: 1. maximum allowable relative shift equals 50mv. 2. for devices procured with a total ionizing dose tolerance guarantee, the post-i rradiation performance is guaranteed at 25c per mil-std-883 method 1019 condition a up to the maximum tid level procured. symbol parameter condition v dd minimum maximum unit t plh1 clk to q c l = 50pf 4.5v to 5.5v 4 10.5 ns 3.0v to 3.6v 4 15.5 t phl1 clk to q c l = 50pf 4.5v to 5.5v 4 11 ns 3.0v to 3.6v 4 16.5 t phl2 clr to q c l = 50pf 4.5v to 5.5v 5 12 ns 3.0v to 3.6v 5 17 f max maximum clock frequency c l = 50pf 4.5v to 5.5v 83 mhz 3.0v to 5.5v 63 t su1 data setup time before clk c l = 50pf 3.0v to 5.5v 2 ns t su2 clr inactive setup time before clk c l = 50pf 3.0v to 5.5v 1 ns t h data hold time after clk c l = 50pf 3.0v to 5.5v 2 ns t w1 minimum pulse width clk high or low c l = 50pf 4.5v to 5.5v 4.5 ns 3.0v to 5.5v 6.5 t w2 minimum pulse width clr low c l = 50pf 3.0v to 5.5v 4.5 ns
7 36-00-04-000 ver. 1.0.0 aeroflex microelectroni cs solutions - hirel packaging 1. all exposed metallized areas are gold plated over electroplated nickel per mil-prf-38535. 2. the lid is electrically connected to v ss . 3. lead finishes are in accordance with mil-prf- 38535. 4. dimension symbol is in accordance with mil- prf-38533. 5. lead position and cola narity are not measured. figure 1. 20-lead flatpack
8 ordering information: UT54ACS273E: smd drawing number: 96578 = UT54ACS273E device type: 02 = 1 rad(si)/sec package type: x = 20-lead ceramic botto m-brazed dual-in-line flatpack lead finish: (notes 1 & 2) a = solder c = gold x = optional 5962 ***** ** * * * * total dose: (note 3 and 4) r = 1e5 rads(si) f = 3e5 rads(si) g = 5e5 rads(si) h = 1e6 rads(si) 03 = 50 to 300 rads(si)/sec class designator: q = qml class q v = qml class v notes: 1. lead finish (a,c, or x) must be specified. 2. if an ?x? is specified when ordering, part marking will match the lead finish and will be either ?a? (solder) or ?c? (gold). 3. total dose radiation must be specified when ordering. qml q and qml v not available without radiation hardening. for protot ype inquiries, contact factory. 4. device type 02 is only offered with a tid tolerance guarantee of 3e5 rads(si) or 1e6 rads(si) and is tested in accordance wi th mil-std-883 test method 1019 condition a and section 3.11.2. device type 03 is only offered with a tid tolerance guarantee of 1e5 rads(si), 3e5 rads(si), and 5e5 rads(si), and is tested in accordance w ith mil-std-883 test method 1019 condition a.
9 www.aeroflex.com info-ams@aeroflex.com our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused aeroflex colorado springs, inc., reserves the right to make changes to any products and services described herein at any time without notice. consult aeroflex or an authorized sales representa tive to verify that the information in this data sheet is current before using this product. aeroflex does not assume any responsibility or liability arising out of the application or use of any product or service described herein, ex cept as expressly agreed to in writing by aeroflex; nor does the purchase, lease, or use of a product or service fro m aeroflex convey a license under any patent rights, copyrights, trademark rights, or any other of the intellectual rights of aeroflex or of third parties. this product is controlled for ex port under the u.s. department of commerce (doc). a license may be required prior to the export of this product from the united states. aeroflex colorado springs - datasheet definition advanced datasheet - product in development preliminary datasheet - shipping prototype datasheet - shipping qml & reduced hirel
10 36-00-04-000 ver. 1.0.0 aeroflex microelectroni cs solutions - hirel datasheet revision history revision date description of change march 2015 version 1.0.0 initial release of datasheet
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